Memory device having terminals for transferring multiple types of data

ABSTRACT

Some embodiments of the invention include a memory device having a number of terminals for transferring input data and output data to and from a memory array. The memory device includes an auxiliary circuit for receiving input auxiliary information associated with the input data and for generating output auxiliary information associated with the output data. The input and output auxiliary information include inverting codes, parity codes, temperature information, and time delay information. The input and output auxiliary information are transferred to and from the memory device on the same terminals that the input data and the output data are transferred. Other embodiments are described and claims.

RELATED APPLICATIONS

This application is a Continuation of U.S. application Ser. No.10/782,717, filed Feb. 19, 2004 which is incorporated herein byreference.

FIELD

Embodiments of the present invention relate generally to semiconductordevices, more particularly, to transfer of data in memory devices.

BACKGROUND

Semiconductors devices such as memory devices reside in many computerand electronic products. Memory devices store data. Input data is storedinto a memory device in a write operation. Output data is outputted fromthe memory device in a read operation.

Most memory devices have data terminals or data pins (input/output pins)for transferring the input and output data. Some memory devices providecodes such as error correction codes so that the input or output datacan be verified.

The codes are usually transferred on code terminals different from thedata terminals. The code terminals occupy space in the memory device,thereby reducing available space of the memory device for otherpurposes.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a memory device according to an embodiment of theinvention.

FIG. 2 is an exemplary timing diagram for the memory device of FIG. 1.

FIG. 3 is a circuit diagram of an auxiliary circuit according to anembodiment of the invention.

FIG. 4 is an exemplary timing diagram for auxiliary circuit of FIG. 3.

FIG. 5 is a circuit diagram of an output inversion controller accordingto an embodiment of the invention.

FIG. 6 shows exemplary data with inversion information according to anembodiment of the invention.

FIG. 7 is an exemplary timing diagram for the output inversioncontroller of FIG. 5.

FIG. 8 is a circuit diagram of an output parity controller according toan embodiment of the invention.

FIG. 9 shows exemplary data with parity information according to anembodiment of the invention.

FIG. 10 is an exemplary timing diagram for the output parity controllerof FIG. 8.

FIG. 11 is a circuit diagram of a temperature reporting circuitaccording to an embodiment of the invention.

FIG. 12 shows exemplary temperature information according to anembodiment of the invention.

FIG. 13 is an exemplary timing diagram for the temperature reportingcircuit of FIG. 10.

FIG. 14 is a circuit diagram of an input inversion controller accordingto an embodiment of the invention.

FIG. 15 is an exemplary timing diagram for the input inversioncontroller of FIG. 14.

FIG. 16 is a circuit diagram of an input parity controller according toan embodiment of the invention.

FIG. 17 is an exemplary timing diagram for the input parity controllerof FIG. 16.

FIG. 18 is a circuit diagram of a calibrating circuit according to anembodiment of the invention.

FIG. 19 shows an exemplary calibrating timing information according toan embodiment of the invention.

FIG. 20 shows an exemplary calibrating timing information for thecalibrating circuit of FIG. 18.

FIG. 21 shows a system according to an embodiment of the invention.

DETAILED DESCRIPTION OF THE DRAWINGS

The following description and the drawings illustrate specificembodiments of the invention sufficiently to enable those skilled in theart to practice the embodiments of the invention. Other embodiments mayincorporate structural, logical, electrical, process, and other changes.In the drawings, like numerals describe substantially similar componentsthroughout the several views. Examples merely typify possiblevariations. Portions and features of some embodiments may be included inor substituted for those of others. The scope of the inventionencompasses the full ambit of the claims and all available equivalents.

FIG. 1 shows memory device according to an embodiment of the invention.Memory device 100 includes a memory array 102 having a plurality ofmemory cells 103 arranged in rows and columns.

Row decode 104 and column decode 106 access memory cells 103 in responseto address signals A0 through AX (A0-AX), provided on address lines 108.

A row address buffer 134 transfers row addresses on lines 108 to rowdecoder 104 based on a signal on line 144. A column address buffer 136transfers column addresses on lines 108 to column decoder 106 based on asignal on line 146.

A control circuit 118 controls the operations of memory device 100 basedon control signals on control lines 120. Examples of the control signalson lines 120 include a Row Access Strobe signal RAS*, a Column AccessStrobe CAS* signal, a Write Enable signal WE*, a Chip Select signal CS*,and a Clock signal CLK. Examples of the operations of memory device 100include a read operation, a write operation, and a refresh operation.

A refresh controller 160 controls the refresh operation of memory device100 to refresh the content of memory cells 103. The write operationwrites input data from data lines 194 to memory cells 103. The readoperation reads output data from memory cells 103 to data lines 194.Data lines 194 are bi-directional data lines; these lines carry both theinput data provided to memory device 100 by an external source and theoutput data outputted from memory device 100. A combination of theaddress signals A0-AX on lines 108 provides the address of a row or acolumn of memory cells 103 being read or written.

Memory device 100 further includes an input data path 111, an outputdata path 122, a strobe transceiver circuit 170, and a data transceivercircuit 190. Data transceiver circuit 190 transfers data between datalines 194 and memory array 102. Strobe transceiver circuit 170 transferstiming information of the data.

Strobe transceiver circuit 170 includes a write strobe unit 171 havingwrite strobe transceivers (WST TX) 172 (172-0 to 172-M), and read strobeunit 173 having read strobe transceivers (RST TX) 174 (174-0 to 174-M).Write strobe unit 171 transfers timing information of the input data.The write strobe signals WDQS (0-M) on lines 182 represent the timinginformation of the input data. Read strobe unit 173 transfers timinginformation of output data. The read strobe signals RDQS (0-M) signalson lines 184 represent the timing information of the output data.

Data transceiver circuit 190 includes data transceivers (D TX) 192(192-0 to 192-N). Data transceivers 192 are bi-directional circuits;they transfer data in both directions. Data transceivers 192 transferboth of the input data and the output data. The data (data signals ordata bits) DQ (0-N) on data lines 194 represent both the input data andthe output data. DQ (0-N) represent the input data when memory device100 receives data during the write operation. DQ (0-N) represent theoutput data when memory device 100 outputs data during the readoperation.

Input data path 111 transfers data between data transceiver circuit 190and memory array 102 during the write operation. Output data path 122transfers data between data transceiver circuit 190 and memory array 102during the read operation.

Memory device 100 further includes an auxiliary circuit 195 forperforming various functions to the input and output data and fortransferring auxiliary information to and from memory device 100 viadata lines 194. Examples of the auxiliary information include invertingcodes, parity codes, temperature codes, or timing calibrating codes, orany combination of these codes.

The inverting codes carry information associated with the inversion ofthe input data, or the output data, or both. The parity codes carryparity information of input data, or the output data, or both. Thetemperature codes carry temperature information of memory device 100.The timing calibrating codes carry calibrating timing information tocalibrate or adjust a timing of the output data.

In memory device 100, the input and output data (DQ-0 through DQ-N)constitute a first type of data, which are the data written to and readfrom memory array 102. The auxiliary information or the auxiliary codesconstitute a second type of data, which are different from the datawritten to or read from memory array 102.

FIG. 1 includes a number of lines such as lines 185, 187, 189, 191, 193,196 and 198. Each of these lines may include a bus of multiple separateconductors. For clarity, FIG. 1 represents a bus 185, 187, 189, 191,193, 196 or 198 as a single line.

Data lines 194 correspond to external terminals or external connectionsof memory device 100. In some embodiments, data lines 194 correspond topins or solder balls on a packaged integrated circuit of memory device100. In other embodiments, data lines 194 correspond to pads on acircuit die of memory device 100.

Memory device 100 may be a dynamic random access memory (DRAM) device, astatic random access memory (SRAM) device, or a flash memory device.Examples of DRAM devices include synchronous DRAM commonly referred toas SDRAM, SDRAM II, SGRAM (Synchronous Graphics Random Access Memory),DDR SDRAM (Double Data Rate SDRAM), DDR II SDRAM, DDR III SDRAM, GDDRIII SDRAM (Graphic Double Data Rate), GDDR IV SDRAM, and Rambus DRAMdevices. In FIG. 1, some elements of memory device 100 are omitted forclarity.

FIG. 2 is an exemplary timing diagram for the memory device of FIG. 1.In FIG. 2, T-1 through T11 represent various times. CLK is the CLKsignal on lines 120 of FIG. 1. DQS represents either one of the RDQS(0-M) signals or one of the WDQS (0-M) signals of FIG. 1. DQ-0 throughDQ-7 represent either the input data or the output data on data lines194. Each of the DQ-0 through DQ-N has a number of bits or data bits B0through B7. FIG. 2 shows eight bits (B0-B7) for each of the DQ-0 throughDQ-7 as an example. In other embodiments, each of the DQ-0 through DQ-7may have other number of bits, for example, 16, 32, 64 or other numbers.

Between times T0-T7, data bits B0-B7 of each of the DQ-0 through DQ-Nare transferred to data lines 194. For example, at time T0 a group ofdata bits B0 of all DQ-0 through DQ-N are transferred; at time T1 agroup of data bits B 1 of all DQ-0 through DQ-N are transferred; and attime T7, a group of data bits B7 of all DQ-0 through DQ-N aretransferred. Thus, eight (8) groups of data bits are transferred betweentimes T0-T7. In FIG. 2, eight groups of data bits are transferredbecause there are eight bits in each of the DQ-0 through DQ-N. Thenumber of groups of data bits, however, may be any number, for example,16, 32, 64 or other numbers.

FIG. 2 also shows a number of groups of auxiliary bits: a first group(A0) of auxiliary bits A0-0 through A0-7, a second group (A1) ofauxiliary bits A1-0 through A1-7, a third group (A2) of auxiliary bitsA2-0 through A2-7, and a fourth group (A3) of auxiliary bits A3-0through A3-7. FIG. 2 shows four groups of auxiliary bits as an example.In other embodiments, the number of groups of auxiliary bits may be lessthan or greater than four. Each group of auxiliary bits carries aparticular auxiliary information. As described previously in FIG. 1,examples of the auxiliary information include inverting codes, paritycodes, temperature codes, or timing calibrating codes, or anycombination of these codes.

All auxiliary bits are transferred to the same data lines 194 that thedata bits B0 through B7 are transferred. A0-0 through A0-7 aretransferred to data lines 194 at time T8. A1-0 through A1-7 aretransferred to data lines 194 at time T9. A2-0 through A2-7 aretransferred to data lines 194 at time T10. A3-0 through A3-7 aretransferred to data lines 194 at time T11. Transferring the auxiliaryinformation or auxiliary bits on the same data lines 194 that the databits are transferred eliminate the need for additional lines (terminals)to transfer the auxiliary bits, thereby saving space in memory device100. In FIG. 2, the bits within one group of auxiliary bits aretransferred to data lines 194 in parallel such that each bit istransferred on a separate line. For example, at time T8, bit A0-0 istransferred on the line corresponding to DQ-0 and bit A0-1 istransferred on the line corresponding to DQ-1. In some embodiments, thebits within one group of auxiliary bits may be transferred to data lines194 in series such that all bits within one group of auxiliary bits aretransferred on the same line. For example, bits A0-0 through A0-7 may betransferred on the same line such as the line corresponding to DQ-0.

Each auxiliary bit within a group of auxiliary bits carries auxiliaryinformation of one of the groups of data bits. Thus, one group ofauxiliary bits carries a specific auxiliary information of all groups ofdata bits.

For example, if the group of auxiliary bits A0-0 through A0-7 carriesinverting codes, then bit A0-0 carries the inverting code for the groupof data bits B0 (bits B0 of all DQ-0 through DQ-N), bit A0-1 carries theinverting code for the group of data bits B 1 (bits B 1 of all DQ-0through DQ-N), and bit A0-7 carries the inverting code for the group ofdata bits B7 (bits B7 of all DQ-0 through DQ-N). Based on the values ofeach of the bits A0-0 through A0-7, memory device 100 decides whether toinvert the data bits B0 through B7 of DQ-0 through DQ-7. In some cases,power is saved by transferring an inverted version of the data bitsinstead of transferring the original version of the data bits.

As another the example, if the group of auxiliary bits A1-0 through A1-7carries parity codes, then bit A1-0 carries the parity code for thegroup of data bits B0, bit A1-1 carries the parity code for the group ofdata bits B1, and bit A1-7 carries the parity code for the group of databits B7. The parity codes allows the data bits B0 through B7 of DQ-0through DQ-7 bits groups of data bits to be verified for validity.

The combination of all auxiliary bits in one auxiliary group carriesauxiliary information such as temperature codes and timing calibratingcodes. In the example of FIG. 2, since there are eight bits in eachgroup of auxiliary bits, there are 256 (28=256) different combinationsin each group of auxiliary bits. Thus, each group of auxiliary bits maybe used to represent one of the 256 different auxiliary information suchas the temperature codes or the timing calibrating codes. For example, acombination of the auxiliary bits A2-0 through A2-7 may represent aparticular temperature code. As another example, a combination of thebits A3-0 through A3-7 may represent a particular timing calibratingcode.

In FIG. 2, the groups of auxiliary bits are transferred at time T8,after the groups of data bits are transferred between times T0-T7. Inother embodiments, at least one group of auxiliary bits is transferredbefore the groups of data bits are transferred. For example, at leastone of the A0 through A4 groups of auxiliary bits may be transferred attime T-1, before time T0.

In FIG. 2, one group of auxiliary bits (e.g., group A0 or A1) carriesthe inverting codes or the parity codes for all of the groups of databits. In some embodiments, more than one group of auxiliary bits areused to carry one particular auxiliary information. For example, morethan one group of auxiliary bits may be used to carry the invertingcodes the inverting codes or the parity codes for all of the groups ofdata bits.

FIG. 3 is a circuit diagram of an auxiliary circuit according to anembodiment of the invention. Auxiliary circuit 300 may be used asauxiliary circuit 195 of memory device 100 of FIG. 1. In FIG. 3,auxiliary circuit 300 includes an input auxiliary controller 310 and anoutput auxiliary controller 320. Input auxiliary controller 310 controlsauxiliary information transferred between data lines 194 and input datapath 111. Output auxiliary controller 320 controls auxiliary informationbetween data lines 194 and output data path 122.

Input auxiliary controller 310 includes an input inversion controller312 for inverting input data bits based on input inverting codesassociated with input data. An input parity controller 314 verifies thevalidity of the input data bits based on input parity codes. Acalibrating circuit 316 enables the memory device to adjust the timingof a transfer of data on data lines 194 based on timing calibratingcodes. The input inverting codes, the input parity codes, and the timingcalibrating codes are received from received from data lines 194. Insome embodiments, input auxiliary controller 310 includes only one ortwo of the circuits 312, 314, and 316.

Output auxiliary controller 320 includes an output inversion controller321 for inverting output data bits based on output inverting codesgenerated by output inversion controller 321. An output paritycontroller 324 generates output parity codes for the output data bits. Atemperature reporting circuit 326 provides temperature codes indicatingthe temperature of the memory device. The output inverting codes, theoutput parity codes, and the temperature codes are transferred to datalines 194. In some embodiments, output auxiliary controller 320 includesonly one or two of the circuits 321, 324, and 326.

FIG. 4 is an exemplary timing diagram for the auxiliary circuit of FIG.3. In FIG. 4, between times Ta-Tb, output data bits and output auxiliarybits are transferred. The output and input data bits are presented bybits B0, and bits B1 through bits B7. The output auxiliary bits includeoutput inverting codes Io-0 through Io-7, output parity codes Po-0through Po-7, and temperature codes TE-0 through TE-7. Between timesTc-Td, input data bits and input auxiliary bits are transferred. Theinput auxiliary bits include input inverting codes Ii-0 through Ii-7,input parity codes Pi-0 through Pi-7, and calibrating codes CA-0 throughCA-7.

Times Ta-Tb may occur during a read operation of memory device 100 (FIG.1). In the read operation, the output data bits and the output auxiliarybits are transferred by memory device 100 to data lines 194. Times Tc-Tcmay occur during a write operation of memory device 100. In the writeoperation, the input data bits and the input auxiliary bits aretransferred to data lines 194 by an external device such as a memorycontroller or a processor.

FIG. 4 shows three groups of input auxiliary bits and output auxiliarybits existed for each of the durations Ta-Tb and Tc-Td. In someembodiments, the number of groups of input auxiliary bits and outputauxiliary bits may be different from three.

FIG. 5 is a circuit diagram of an output inversion controller accordingto an embodiment of the invention. Output inversion controller 500 maybe used as output inversion controller 321 of FIG. 3. In FIG. 5, outputinversion controller 500 includes a calculating unit 410, an outputinverting code storage 425, and an output inverting unit 430.Calculating unit 410 determines whether to invert outbound data bitsDout-0 through Dout-N on lines 322 by generating an output invertingcode Io for each group of data bits. For example, if there are M groupsof data bits, M number of Io codes (Io-0 through Io-M) is generated.Inverting unit 430 inverts Dout-0 through Dout-N based on the Io code.Output inverting code storage 425 stores the Io code for each group ofthe outbound data bits Dout-0 through Dout-N. Output inverting codestorage 425 includes a number of auxiliary lines 411 to carry the Io-0through Io-M codes. Lines 411 connect to lines 392. For clarity, FIG. 4does not show the connections between lines 411 and lines 392.

Data bits DO-0 through DO-N on lines 392 represent the data bits DQ(0-N) on data lines 194 in a read operation when data is outputted frommemory device 100 (FIG. 1). For simplicity, DO-0 through DO-N arereferred to as DO.

The outbound data bits Dout-0 through Dout-N on lines 322 represent databits outputted along data path 122. DO-0 through DO-N on lines 392 arerelated to Dout-0 through Dout-N on lines 322. Depending on thecondition of the Io code, DO-0 through DO-N may be either an invertedversion or a non-inverted version (original version) of Dout-0 throughDout-N. For simplicity, Dout-0 through Dout-N are referred to as Dout.

Calculating unit 410 includes a comparing portion 412, a storage portion416, a math portion 420, and a decision portion 422. Comparing portion412 has a number of comparators 414 (414-0 through 414-N) for comparingDout-0 through Dout-N on lines 322 with the previous output data bitsDOp-0 through DOp-N on lines 415. DOp-0 through DOp-N are the outputdata bits on lines 392 from a previous output cycle. In someembodiments, each of the comparators 414 includes an exclusive OR logicfor comparing the values of two corresponding output data bits.

Each of the comparators 414 compares a value of an outbound data bit(Dout) with a value of a corresponding previous output data bit (DOp).For example, comparator 414-0 compares the value of Dout-0 with thevalue of the DOp-0. As another example, comparator 414-N compares thevalue of Dout-N with the value of DOp-N. The value of the bit of datamay be a logic zero (low) or a logic one (high).

After the comparison, each of the comparators 414 provides a comparisonresult to one of the lines 417. The comparison result may be either alogic zero or a logic one. In some embodiments, the logic zero of thecomparison result indicates that the values of Dout data bits and thevalues of DOp data bits are the same or matched; the logic one ofcomparison result indicates that the values of Dout data bits and thevalues of DOp data bits are different or mismatched. For example, ifDout-0 and DOp-0 are the same, the comparison result on line 417-0 wouldbe the logic zero; if Dout-0 and DOp-0 are different, the comparisonresult on line 417-0 would be the logic one.

Storage portion 416 includes a number of registers 418 (418-0 to 418-N)to store the values of the output data bits represented by DOp-0 throughDOp-N. After each time DO appears to lines 392, storage portion 416replaces or updates the contents of registers 418 with the value of DO.Thus, DO in the current output cycle will become DOp in the next outputcycle.

Math portion 420 performs a math operation on the comparison resultsprovided on lines 417. Math portion 420 outputs a math result on lines419. The combination of signals (or bits) on lines 419 represents anumber, indicated by X, where X is an integer. X is the number of thebits of Dout that have a different value with corresponding bits DOp.For example, if the current Dout has eight bits with bit values of00011111 and if the previous DOp is 00011100, X would be two (2) becausethe last two bits of Dout and the corresponding last two bits of DO havedifferent values. As another example, if the current Dout is 00011111and the previous DOp is 11111111, X would be three (3) because the firstthree bits of Dout and the first three bits of DOp have differentvalues.

Decision portion 422 sets the value of the Io code based on the number Xon lines 419. In some embodiments, decision portion 422 sets the valueof the Io code at a first value (e.g., low) when X is less than or equalto B/2 and sets the Io code at a second value (e.g., high) when X isgreater than B/2. B is the number of the bits of the outbound data(Dout) which is also the number of the bits of the output data (DQ). Forexample, if B equals eight, the Io code is set to a first value (e.g.,low) when X is less than or equal to four (B/2=4) and the Io code is setto the second value (e.g., high) when X is greater than four.

Output inverting code storage 425 includes a numbers of cells orregisters 426. Each register 426 stores one output inverting code. Thus,many different inverting codes for different groups of data bits may bestored in registers 426. At a particular time, output inverting codestorage 425 outputs the stored output inverting codes Io-0 through Io-Mto data transceiver circuit 190 for transferring to data lines 194. Forexample, at a particular number of cycles of a clock signal, the CTL0signal may be activated to output the Io-0 through Io-M codes to datatransceiver circuit 190, which transfers the Io-0 through Io-M codes todata lines 194. An external device connected to memory device 100 mayuse the Io-0 through Io-M codes for inverting DQ-0 through DQ-N afterthe external device receives DQ-0 through DQ-N from memory device 100.

Output inverting unit 430 includes an input node 433 for receiving theIo code, and a number of switching devices 442. Each of the switchingdevices 442 is located on a path between data transceiver circuit 190and output data path 122. Each switching device 442 includes twoseries-connected inverters 452 and 462 and a switch 472 connected aroundone of the inverters 452 and 462.

Switching devices 442 are controlled by the Io code. Switch 472 turns onwhen Io is at one value or state (e.g., high). When switch 472 turns on,inverter 462 is bypassed; Dout from lines 322 bypasses inverter 462 andpasses through only inverter 452 and switch 472 and becomes DO at lines392. In this case, DO is an inverted version of Dout. Switch 472 turnsoff when Io is at another value (e.g., low). When switch 472 turns off,inverter 462 is not bypassed; Dout from lines 322 passes through bothinverters 452 and 462 becomes DO at lines 392. In this case, DO is atrue version of Dout.

FIG. 6 shows exemplary data with inversion information. DOp is theprevious output data bits on lines 392 (FIG. 5). Dout-0 to Dout-7 in row1 through row 16 represent 16 different exemplary groups of currentoutbound data bits outputted on lines 322 from data path 122. As anexample, each group of DOp and Dout has eight bits (bits 0). The“inverted Dout-0 to Dout-7” in a row is the inverted version of Dout-0to Dout-7 in the same row. In FIG. 5, DO on lines 392 is not always aninverted version of Dout. The value of Io determines whether or not Doutis inverted such that DO is an inverted version of Dout.

In FIG. 6, DOp is 00000111. These previous bit values are used as a baseto compare with each of the bit values of the 16 possible current Doutbits in row 1 through row 16.

X represents the number of differences in bit values between DOp and thecorresponding eight bit values of each of the Dout-0 to Dout-7 in eachrow. For example, in comparing bit-to-bit among bits B0 of DOp with bitsB0 of Dout in row 1, there are eight differences in the bit values.Thus, X equals eight (8) in row 1. As another example, in comparing DOpwith Dout in row 6, there are three differences in the bit values. Thus,X equals three (3) in row 6.

Y represents the numbers of differences in bit values between DOp andthe corresponding bit values of each of the inverted Dout-0 to Dout-7 ineach row. For example, in comparing bit-to-bit among bits B0 of DOp withbits B0 of inverted Dout in row 1, there are no differences in the bitvalues. Thus, Y equals zero in row 1. As another example, in comparingDOp with inverted Dout in row 6, there are five differences in the bitvalues. Thus, Y equals five (5) in row 6.

As described in FIG. 5, X is calculated by calculating unit 410. The Iocode is set based on the value of X. For example, Io is zero when X isless than or equal to B/2 and Io is one when X is greater than B/2 whereB is the number of bits of DO (DOp or Dout). In FIG. 6, B=8. Thus, inrow 1, Io is one (1) because X is greater than four (4). In row 6, Io iszero because X is less than four.

The value of Io indicates whether the Dout is inverted. For example, inrow 1, since Io is one, Dout is inverted and the inverted version ofDout is transferred to lines 392. The inverted Dout of row 1 is00000111. Lines 392 have the previous value DOp of 00000111, which isalso equal to value of the inverted Dout 00000111. Thus, when theinverted Dout is transferred to lines 392, the value or signals on lines392 need not to be switched or toggled because the inverted Dout and theprevious DOp have the same value. In this case, since no switching(toggling) is done at lines 392, the number of switches in bit valuesbetween DOp and inverted Dout is zero (Y=0 in row 1).

In row 1, if Dout were not inverted, the number of switches at lines 392would have been eight (X=8). Thus, in the example regarding row 1,inverting Dout before transferring Dout to lines 392 reduces the numberof switches at lines 392 from eight to zero. Power is saved when thenumber of switches is reduced.

As another example, in row 6, since Io is zero, a non-inverted or trueversion of Dout is transferred to lines 392. In comparing the bits00000000 of Dout in row 6 with the bits 00000111 of DOp, there are threebits having different value (X=3). Thus, when the true version of Doutis transferred to lines 392, bits B0 of Dout-5, Dout-6, and Dout-7 areswitched. In the example regarding row 6, the number of switches in bitvalues between DOp and Dout is three. In row 6, if Dout were invertedand the inverted Dout in row 6 is transferred to lines 392, the numberof switching would have been five (Y=5). Hence, in this case,transferring the true version of Dout includes fewer number of switchesin bit values.

The examples above regarding row 1 and row 6 and the table in FIG. 6show that depending on the value of the Io code, an inverted version ora true version of Dout is transferred. Regardless of which version ofDout is transferred, the number of switches between bit values of thedata being transferred is kept at the lowest value (between X and Y),thereby improving power consumption.

FIG. 7 is an exemplary timing diagram for the output inversioncontroller of FIG. 5. In FIG. 7, between times T0-T7, the group of databits DQ-0 through DQ-7 are transferred to data lines 194 (FIG. 5). Attime T8, the group of output inverting codes Io-0 through Io-7 istransferred to data lines 194. Each of the Io-0 through Io-7 codes is anoutput inverting code for one of the groups of data bits DQ-0 throughDQ-7. For example, Io-0 is the output inverting code for the group ofdata bits B0 of DQ-0 through DQ-7 transferred at time T0. Io-1 is theoutput inverting code for the group of data bits B1 of DQ-0 through DQ-7transferred at time T1. Io-7 is the output inverting code for the groupof data bits B7 of DQ-0 through DQ-7 transferred at time T7. Based onthe Io-O through Io-7 codes, the groups of data bits DQ-0 through DQ-7are inverted accordingly.

FIG. 8 is a circuit diagram of an output parity controller according toan embodiment of the invention. Output parity controller 800 may be usedas output parity controller 324 of FIG. 3. Output parity controller 800includes an output parity generator 710 and an output parity codestorage 725. Output parity generator 710 generates the output paritycode Po based on the outbound data bits Dout-0 through Dout-N. Since Pois the parity of Dout, Po is also the parity of DO because DO isgenerated from Dout.

Output parity generator 710 connects to lines 322 for receiving Dout-0through Dout-N. In some embodiments, output parity generator 710connects to lines 392 (FIG. 3) for receiving DO. In some embodiments,output parity generator 710 includes at least one exclusive OR logic forcalculating the value of Po. Output parity generator 710 provides Po tooutput parity code storage 725.

Output parity code storage 725 includes a numbers of cells or registers726. Each register 726 stores one output parity code. Thus, manydifferent parity codes for different groups of data bits can be storedin registers 726. Output parity code storage 725 includes a number ofauxiliary lines 711 to carry the Po-0 through Po-M codes. Lines 111connect to lines 392. For clarity, FIG. 7 does not show the connectionsbetween lines 111 and lines 392. At a particular time, output paritycode storage 725 outputs the stored parity codes Po-0 through Po-M todata transceiver circuit 190 for transferring to data lines 194. Forexample, at a particular number of cycles of a clock signal, the CTL1signal may be activated to output the Po-0 through Po-M codes to datatransceiver circuit 190, which transfers the Po-0 through Po-M codes todata lines 194. An external devices connected to memory device 100 mayuse the Po-0 through Po-M codes for verifying DQ-0 through DQ-N afterthe external device receives DQ-0 through DQ-N from memory device 100.

FIG. 9 shows exemplary data with output parity information. Bits B0represent the bits B0 of group of data bits Dout-0 through Dout-7. Theparity bit Po represents the value of the output parity bit Po. Po iseither zero or one. In the exemplary data of FIG. 9, Po is zero whenbits B0 have an even number of zero bits (or ones bits); and Po is onewhen bits B0 has an odd number of zero bits (or ones bits). For example,in row 1 and row 3, Po is zero because each of the data in row 1 and row3 has an even number of zero (or one) bits. As another example, in row 6and row 14, Po is one because each of the data in row 6 and row 14 hasan odd number of zero (or one) bits.

In the above example, Po is zero when bits B0 have an even number ofzero bits (or ones bits); and Po is one when bits B0 have an odd numberof zero bits (or ones bits). In some embodiments, Po is zero when bitsB0 have an odd number of zero bits (or ones bits); and Po is one whenbits B0 have an even number of zero bits (or ones bits).

FIG. 10 an exemplary timing diagram for the output parity controller ofFIG. In FIG. 10, between times T0-T7, the group of data bits DQ-0through DQ-7 are transferred to data lines 194 (FIG. 5). At time T8, thegroup of output parity codes Po-0 through Po-7 is also transferred todata lines 194. Each of the Po-0 through Po-7 codes is an output paritycode for one of the groups of data bits DQ-0 through DQ-7. For example,Po-0 is the output parity code for the group of data bits B0 of DQ-0through DQ-7 transferred at time T0. Po-1 is the output parity code forthe group of data bits B1 of DQ-0 through DQ-7 transferred at time T1.Po-7 is the output parity code for the group of data bits B7 of DQ-0through DQ-7 transferred at time T7. Based on the Po-0 through Po-7codes, the groups of data bits DQ-0 through DQ-7 are verifiedaccordingly.

FIG. 11 is a circuit diagram of a temperature reporting circuitaccording to an embodiment of the invention. Temperature reportingcircuit 1100 may be used as temperature reporting circuit 326 of FIG. 3.In FIG. 11, temperature reporting circuit 1100 includes a temperaturesensor 1110, and a signal converter 1120. Temperature sensor 1110 sensesthe temperature of memory device 100 (FIG. 1) and produces temperatureinformation. In some embodiments, the temperature information is ananalog temperature information. Signal converter 1120 produces a digitaltemperature information sensed by temperature sensor 1110. In someembodiments, signal converter 1120 includes an analog to digitalconverter for converting an analog temperature information into adigital temperature information. Signal converter 1120 produces thedigital temperature information in a parallel format.

Signal converter 1120 includes a number of auxiliary lines 1111 to carrytemperature codes TE-0 through TE-M. Signal converter 1120 outputs theTE-0 through TE-M codes to data transceiver circuit 190 for transferringto data lines 194. The combination of the TE-0 through TE-M codesrepresents the temperature of memory device 100. For example, if TE-0through TE-M have eight bits (M=7), each of the 256 (28) combinationsrepresents one of 256 possible temperatures of memory device 100.

In some embodiments, an external device connected memory device 100receives the TE-0 through TE-M codes to control a refresh rate of memorydevice 100. The refresh rate is the rate at which refresh controller 160(FIG. 1) refreshes memory cells 103. Examples of the external deviceinclude memory controllers and processors. In some embodiments, theexternal device may provide refresh control signals to memory device 100based on the TE-0 through TE-M codes. Memory device 100 uses the refreshcontrol signals to control the refresh rate. For example, at sometemperature such as at a temperature lower than a normal operatingtemperature of memory device 100, refresh controller 160 may reduce theactivation of the REFRESH (FIG. 1) signal to reduce the refresh rate tosave power.

FIG. 12 shows exemplary temperature information. Bits TE-0 through TE-7represent the temperature codes TE-0 through TE-M of FIG. 11. FIG. 12shows eight bits of temperature codes (M=7) as an example. In someembodiments, the number of bits of the temperature codes may bedifferent from eight.

Each combination of the TE-0 through TE-7 bits represents a differenttemperature. FIG. 12 shows eight different combinations of TE-0 throughTE-7 (COL 1 to COL 8) representing eight different temperatures (bottomrow). For example, in COL 2, TE-0 through TE-7 has the combination00000001 representing 15 degrees Celsius. As another example, in COL 8,TB0-TB has the combination 01111111 representing 105 degrees Celsius.Since eight bits of the TE-0 through TE-7 codes have 256 combinations,256 different temperatures may be represented by the TE-0 through TE-7codes. FIG. 12 shows eight combinations (eight columns) of TE-0 throughTE-7 as an example, other combinations among the 256 combinations ofTE-0 through TE-7 can be used to represent other temperatures differentfrom the temperatures shown in FIG. 12.

FIG. 13 is an exemplary timing diagram for the temperature reportingcircuit of FIG. 11. In FIG. 13, between times T0-T7, the group of databits DQ-0 through DQ-7 are transferred to data lines 194 (FIG. 11). Attime T8, the group of output temperature codes TE-0 through TE-7 istransferred to data lines 194. The combination of the TE-0 through TE-7codes represents a temperature of memory device 100 (FIG. 1). Forexample the combination of the TE-0 through TE-7 codes may be 00111111(column 7 of FIG. 12), which represent a temperature of 90 degreesCelsius.

FIG. 14 is a circuit diagram of an input inversion controller accordingto an embodiment of the invention. Input inversion controller 1400 maybe used as input inversion controller 312 of FIG. 3. In FIG. 14, databits DI-0 through DI-N on lines 391 represent the input data bits DQ(0-N) in a write operation when data is inputted to memory device 100(FIG. 1). For simplicity, DI-0 through DI-N are referred to as DI.

Inbound data signals or inbound data Din-0 through Din-N on lines 311represent data inputted to input data path 111. Din-0 through Din-N arerelated to DI-0 through DI-N. Din-0 through Din-N may be either aninverted version or a true version of DI-0 through DI-N. For simplicity,Din-0 through Din-N are referred to as Din.

Input inversion controller 1400 includes a control unit 1410, an inputdata storage 1425, and an input inverting unit 1430. Input data storage1425 stores a number of groups of data bits DI-0 through DI-N providedfrom lines 391 during a write cycle. The number of groups of data bitsDI-0 through DO-N have corresponding input inverting codes Ii-0 throughIi-M. Each input inverting code carries inversion information of acorresponding group of data bits. Ii-0 through Ii-M are provided toinput inversion controller 1400 on auxiliary lines 1411, which connectto lines 391. For clarity, FIG. 14 does not show the connections betweenlines 1411 and lines 391. Control unit 1410 enables input inverting unit1430 whether or not to invert the each group of data bits stored ininput data storage 1425 based on the Ii-0 through Ii-M codes. Inputinverting unit 1430 provides either the inverted or the true version ofthe groups of data bits DI-0 through DI-N to input data path 111.

FIG. 15 is an exemplary timing diagram for the input inversioncontroller of FIG. 14. In FIG. 15, between times T0-T7, the group ofdata bits DQ-0 through DQ-7 are transferred from data lines 194 (FIG.14). At time T8, the group of input inverting codes Ii-0 through Ii-7 istransferred from data lines 194. Each of the Ii-0 through Ii-7 codes isan input inverting code for one of the groups of data bits DQ-0 throughDQ-7. For example, Ii-0 is the input inverting code for the group ofdata bits B0 of DQ-0 through DQ-7 transferred at time T0. Ii-1 is theinput inverting code for the group of data bits B 1 of DQ-0 through DQ-7transferred at time T1. Ii-7 is the input inverting code for the groupof data bits B7 of DQ-0 through DQ-7 transferred at time T7. Based onthe Ii-0 through Ii-7 codes, the groups of data bits DQ-0 through DQ-7are inverted accordingly.

FIG. 16 is a circuit diagram of an input parity controller according toan embodiment of the invention. Input parity controller 1600 may be usedas output parity controller 324 of FIG. 3. Input parity controller 800includes an internal parity generator 1610, an internal parity storage1625, and a number of comparators 1630. Internal parity generator 1610generates an internal parity code Pii for each group of input data bitsDI-0 through DI-N. For example, if there are M groups of data bits, Mnumber of Pi codes (Pii-0 through Pii-M) is generated. In someembodiments, internal parity generator 1610 includes at least oneexclusive OR logic for calculating the parity of each group of inputdata bits DI-0 through DI-N. Internal parity generator 1610 provides theinternal parity codes to internal parity storage 1625.

Comparators 1630 receives a number of input parity codes Pi-0 throughPi-M from auxiliary lines 1611, which connect to lines 391. For clarity,FIG. 16 does not show the connections between lines 1611 and lines 391.At a particular time, input parity storage 1625 provides the storedinternal parity codes to comparators 1630. For example, at a particularnumber of cycles of a clock signal, the CTL2 signal may be activated tooutput the Pi-0 through Pi-M codes to comparators 1630. Comparators 1630compare the stored Pii-0 through Pii-M with Pi-0 through Pi-M and outputverification signals VER-0 through VER-M. The states of the VER-0through VER-M signals determine the validity of the groups of input databits DI-0 through DI-N.

FIG. 17 is an exemplary timing diagram for the input parity controllerof FIG. 16. In FIG. 17, between times T0-T7, the group of data bits DQ-0through DQ-7 are transferred from data lines 194 (FIG. 16). At time T8,the group of input parity codes Pi-0 through Pi-7 is transferred fromdata lines 194. Each of the Pi-0 through Pi-7 codes is an input paritycode for one of the groups of data bits DQ-0 through DQ-7. For example,Pi-0 is the input parity code for the group of data bits B0 of DQ-0through DQ-7 transferred at time T0. Pi-1 is the input parity code forthe group of data bits B1 of DQ-0 through DQ-7 transferred at time T1.Pi-7 is the input parity code for the group of data bits B7 of DQ-0through DQ-7 transferred at time T7. Based on the Pi-0 through Pi-7codes, the groups of data bits DQ-0 through DQ-7 are verifiedaccordingly.

FIG. 18 is a circuit diagram of a calibrating circuit according to anembodiment of the invention. Calibrating circuit 1800 may be used ascalibrating circuit 316 of FIG. 3. In FIG. 18, calibrating circuit 1800receives a number of timing calibrating codes CA-0 through CA-M. Acombination of the CA-0 through CA-M codes on auxiliary lines 1811represents a timing delay. In some embodiments, the CA-0 through CA-Mcodes is provided to memory device 100 (FIG. 1) by an external devicesuch as a memory controller or a processors.

Calibrating circuit 1800 includes a decoder 1820 and a storage unit1830. Decoder 1820 decodes the CA-0 through CA-M code to providecalibrating information representing the timing delay. Storage unit 1830stores the timing delay provided by decoder 1820. Based on the timingdelay, storage unit 1830 sends an adjust signal ADJ to control circuit118 (FIG. 1). In some embodiments, the ADJ signal has multiple bits andthe combination of the multiple bits corresponds to the timing delaystored in storage unit 1830. Based on the ADJ signal, a control circuitsuch as control circuit 118 adjusts the timing of the transfer of datafrom data transceiver circuit 190 to data lines 194.

In some embodiments, the external device (e.g., memory controller orprocessor) sends the CA-0 through CA-M codes memory device 100 during acalibrating process or an initialization process. In the calibratingprocess, the external device may send different groups of the CA-0through CA-M codes to memory device 100. In response to the CA-0 throughCA-M codes codes, memory device 100 may transfer multiple output data inmultiple data transfers to the external device at different times. Eachtime, each of the multiple output data has different timing delaycorresponding to each group of the CA-0 through CA-M codes. The externaldevice may detect the most accurate data transfer among the multipledata transfers by memory device 100. In some embodiments, after the mostaccurate data transfer is detected, the external device sends memorydevice 100 a final group of the CA-0 through CA-M codes representing atiming delay corresponding to the most accurate data. Storage unit 1830stores the final group of the CA-0 through CA-M codes. Control circuit118 adjusts the timing of data transceivers 192 such that after thecalibrating process, subsequent data transferred from memory device 100to the external device are more accurate.

FIG. 19 shows exemplary calibrating timing information. CA-0 throughCA-7 represent the timing calibrating codes CA-0 through CA-M of FIG.18. FIG. 19 shows eight bits of the calibrating codes (M=7) as anexample. In some embodiments, the number of bits of the timingcalibrating codes may be different from eight.

Each combination of the CA-0 through CA-7 codes represents a differenttiming delay. FIG. 19 shows eight different combinations of the CA-0through CA-7 codes (COL 1 to COL 8) representing eight different timingdelays (bottom row). For example, in COL 2, the CA-0 through CA-7 codeshave the combination 00000001, which represents a time delay of 150picoseconds. As another example, in COL 8, the CA-0 through CA-7 codeshave the combination 01111111, which represents a time delay of 200picoseconds. Since eight bits of the CA-0 through CA-7 codes have 256combinations, 256 different time delays may be represented by the CA-0through CA-7 codes. FIG. 19 shows eight combinations (eight columns) ofCA-0 through CA-7 codes as an example, other combinations among the 256combinations of the CA-0 through CA-7 codes can be used to representother values for the time delay different from the values shown in FIG.19.

FIG. 20 is an exemplary timing diagram for the calibrating circuit ofFIG. 18 In FIG. 20, between times T0-T7, the group of data bits DQ-0through DQ-7 are transferred from data lines 194 (FIG. 18). At time T8,the group of timing calibrating codes CA-0 through CA-7 is transferredfrom data lines 194. The combination of the CA-0 through CA-7 codesrepresents a time delay. For example the combination of the CA-0 throughCA-7 codes may be 00001111 (column 5 of FIG. 19), which represent a timedelay of 50 picoseconds.

FIG. 21 shows a system according to an embodiment of the invention.System 2100 includes a processor 2110, a memory device 2140, a memorycontroller 2130, a graphic controller 2140, and an input and output(I/O) controller 2150, a display 2152, a keyboard 2154, a pointingdevice 2156, and a peripheral device 2158. A bus 2160 couples all ofthese devices together. A clock generator 2170 provides a clock signalto at least one of the devices of system 2100 via bus 2160. An exampleof clock generator 2170 includes an oscillator in a circuit board suchas a motherboard. Two or more devices shown in system 2100 may be formedin a single chip.

Memory device 2140 may be memory device 100 (FIG. 1). Further, at leastone of the devices shown in system 2100 includes an auxiliary circuitsuch as auxiliary circuit 195 (FIG. 1) for receiving input auxiliaryinformation, generating output auxiliary information, and performingfunctions on input and output data transferred between memory device2140 and other devices in system 2100.

Bus 2160 may be interconnect traces on a circuit board or may be one ormore cables. Bus 2160 may also couple the devices of system 2100 bywireless means such as by electromagnetic radiations, for example, radiowaves. Peripheral device 2158 may be a printer, an optical device suchas CD-ROM and DVD reader and writer, a magnetic device reader and writersuch as a floppy disk driver, or an audio device such as a microphone.

System 2100 represented by FIG. 21 includes computers (e.g., desktops,laptops, hand-helds, servers, Web appliances, routers, etc.), wirelesscommunication devices (e.g., cellular phones, cordless phones, pagers,personal digital assistants, etc.), computer-related peripherals (e.g.,printers, scanners, monitors, etc.), entertainment devices (e.g.,televisions, radios, stereos, tape and compact disc players, videocassette recorders, camcorders, digital cameras, MP3 (Motion PictureExperts Group, Audio Layer 3) players, video games, watches, etc.), andthe like.

CONCLUSION

Various embodiments of the invention provide circuits and methods fortransferring data and auxiliary information to and from a memory deviceusing the same lines.

Some embodiments of the invention include a memory device having aplurality of data lines, a memory array for storing data, a transceivercircuit, and an auxiliary circuit having auxiliary lines for carryingauxiliary information. The transceiver circuit connects to the memoryarray and the data lines for transferring the data between the memoryarray and the data lines. The transceiver circuit also connects to theauxiliary circuit for transferring the auxiliary information between theauxiliary lines and the data lines.

Other embodiments of the invention include a method of transferring datain a memory device. The method transfers a number of groups of data bitson a plurality of data lines, the data bits having a first type of data.The method also transfers a plurality of auxiliary bits on the datalines, the auxiliary bits having a second type of data. The methodfurther performs a first function on bits of each of the groups of databits and performs a second function on the auxiliary bits.

It is to be understood that the above description is intended to beillustrative, and not restrictive. Many other embodiments will beapparent to those of skill in the art upon reading and understanding thepresent application including the drawings and the claims. Althoughspecific embodiments are described herein, those skilled in the artrecognize that other embodiments may be substituted for the specificembodiments shown to achieve the same purpose. This application coversany adaptations or variations of the present invention. Therefore, theembodiments of the present invention are limited only by the claims andall available equivalents.

1. A memory device comprising: a plurality of data lines fortransferring data and auxiliary information, wherein at least one of thedata lines is configured for transferring at least one bit of the dataat a first time and for transferring at least one bit of the auxiliaryinformation at a second time; a memory array for storing the data; anauxiliary circuit including auxiliary lines for carrying the auxiliaryinformation; and a transceiver circuit coupled to the memory array andthe data lines for transferring the data between the memory array andthe data lines, the transceiver circuit also couples to the auxiliarycircuit for transferring the auxiliary information between the auxiliarylines and the data lines.
 2. The memory device of claim 1 furthercomprising a plurality of strobe lines for transferring timinginformation of the data.
 3. The memory device of claim 1, wherein theauxiliary circuit includes an inversion controller coupled to thetransceiver circuit and the memory array for conditionally inverting thedata.
 4. The memory device of claim 2, wherein the inversion controllerincludes a storage unit for storing inverting codes of the data, andwherein the transceiver circuit couples to the storage unit fortransferring the inverting codes between the inversion controller andthe data lines.
 5. The memory device of claim 1, wherein the auxiliarycircuit includes a parity controller coupled to the transceiver circuitand the memory array for generating a number of parity codes for thedata.
 6. The memory device of claim 1, wherein the auxiliary circuitincludes a temperature reporting circuit coupled to the transceivercircuit for generating temperature information of the device.
 7. Thememory device of claim 1, wherein the auxiliary circuit includes acalibrating circuit coupled to the transceiver circuit for providing atime delay based on the auxiliary information.
 8. A memory devicecomprising: a plurality of data lines for transferring data andauxiliary information, wherein at least one of the data lines isconfigured for transferring at least one bit of the data at a first timeand for transferring at least one bit of the auxiliary information at asecond time; a memory array for storing input data and output data; aninput auxiliary circuit configured for receiving input auxiliaryinformation of the input data and configured for performing a functionon the input data; an output auxiliary circuit configured for generatingoutput auxiliary information of the output data and configured forperforming a function on the output data; and a transceiver circuitcoupled to the memory array and the data lines for transferring theinput and output data between the memory array and the data lines, thetransceiver circuit also couples to the input and output auxiliarycircuits for transferring the input and output auxiliary informationbetween the input and output auxiliary circuits and the data lines. 9.The memory device of claim 8 further comprising a plurality of writestrobe lines for transferring timing information of the input data. 10.The memory device of claim 9 further comprising a plurality of readstrobe lines for transferring timing information of the output data. 11.The memory device of claim 8, wherein the output auxiliary circuitincludes an output inverting circuit for conditionally inverting theoutput data based on the output auxiliary information.
 12. The memorydevice of claim 8, wherein the output auxiliary circuit includes anoutput parity generator for generating a number of parity codes for theoutput data.
 13. The memory device of claim 8, wherein the outputauxiliary circuit includes a temperature reporting circuit forgenerating temperature information of the device.
 14. The memory deviceof claim 8, wherein the input auxiliary circuit includes an inputinverting circuit for conditionally inverting the input data based onthe input auxiliary information.
 15. The memory device of claim 8,wherein the input auxiliary circuit includes an input parity generatorfor generating a number of parity codes for the input data.
 16. Thememory device of claim 8, wherein the input auxiliary circuit includes acalibrating circuit for providing a time delay based on the inputauxiliary information.
 17. A method comprising: transferring at leastone bit of the data on a data line at a first time; transferring atleast one bit of the auxiliary information on the data line at a secondtime; storing the data in a memory array; transferring the data betweenthe memory array and the data line; and transferring the auxiliaryinformation between an auxiliary line and the data line.
 18. The methodof claim 17 further comprising: transferring timing information of thedata on a strobe line.
 19. The method of claim 18, wherein transferringthe timing information includes transferring timing information of inputdata to be stored in the memory array.
 20. The method of claim 17,wherein transferring the timing information includes transferring timinginformation of output data outputted from the memory array.
 21. Themethod of claim 17 further comprising: conditionally inverting the data.22. The method of claim 17 further comprising: storing inverting codesof the data; and transferring the inverting codes on the data line. 23.The method of claim 17 further comprising: generating a number of paritycodes for the data.
 24. The method of claim 17 further comprising:generating temperature information.
 25. The method of claim 17 furthercomprising: providing a time delay based on the auxiliary information.